Emerging Photonic and Electronic Materials Lab
Journal Publications
in preparation - electrical properties of alpha-Ga2O3
in preparation - properties of SnO2 lithiophilic layer
-
C. Park+, S. Kim+, D. Lee, and R. B. Chung*, "High-performance tin oxide field-effect transistors deposited by thermal atomic layer deposition", Mater. Today Comm. 37, 107064 (2023). (+: authors with equal contributions)
-
J. Kim, G. Lee, R. B. Chung*, P. J. Kim*, and J. Choi*, "Homogeneous Li deposition guided by ultra-thin lithiophilic layer for highly stable anode-free batteries", Energy Storage Materials 61, 102899 (2023).
-
H. Y. Kang+, M. J. Yeom+, J. Y. Yang, Y. Choi, J. Lee, C. Park, G. Yoo*, and R. B. Chung*, "Epitaxial κ-Ga2O3/GaN heterostructure for high electron mobility transistors", Mater. Today Phys. 31, 101002 (2023). (Link) (+: authors with equal contributions)
-
C. Park+, S. Kim+, G. Lee, and R. B. Chung*, "Tin Oxide Field-Effect Transistors Deposited by Thermal Atomic Layer Deposition with H₂O Reactant", Appl. Sci. Converg. Technol. 31, 145 (2022) (Link) (+: authors with equal contributions)
-
H. Y. Kang+, Y. Choi+, K. Pyeon, T. H. Lee, R. B. Chung*, "Experimental and theoretical investigation of the effect of Sn on κ-Ga2O3 growth", J Mater Sci 57, 19882–19891 (2022). (Link) (+: authors with equal contributions)
-
G. Lee+, M. Seong+, S. Kim+, K. Pyeon, and R. B. Chung*, "Conductive SnO2-x thin films deposited by thermal ALD with H2O reactant", Vacuum 200, 111018 (2022). (Link) (+: authors with equal contributions)
-
M. J. Yeom, J. Y. Yang, C. H. Lee, J. Heo, R. B. Chung*, and G. Yoo*, "Low sub-threshold slope AlGaN/GaN MOS-HEMT with spike annealed HfO2 gate dielectric", micromachines 12, 1441 (2021). (Link)
-
H. Y. Kang+, H. Kang+, E. Lee+, G. Lee, and R. B. Chung*, "Sn-induced phase stabilization and enhanced thermal stability of κ-Ga2O3 grown by mist-CVD", ACS Omega 6, 46, 31298 (2021). (Link) (+: authors with equal contributions)
-
Y. J. Jeong, J. Y. Yang, C. H. Lee, R. Park. G. Lee, R. B. Chung*, and G. Yoo*, "Fluorine-based plasma treatment for hetero-epitaxial β-Ga2O3 MOSFETs", Appl. Surf. Sci. 558, 149936 (2021). (Link)
-
이경렬, 박류빈, R. B. Chung*, "열처리 공정을 이용한 Si-doped β-Ga2O3 박막의 전기적 특성의 이해", J. Microelectron. Packag. Soc., 27(4), 19-24 (2020). (Link)
-
R. B. Chung*, "Photo- and electro-luminescence studies of semipolar (11-22) InxAl1-xN", J. Appl. Physics 128, 043104 (2020). (Link)
-
D.-H. Hop, R. B. Chung, Y.-W. Heo, J.-J. Kim, and J.-H. Lee, "Oxygen nonstoichiometry and electrical properties of La2–xSrxNiO4+δ (0 ≤ x ≤ 0.5)", J. Korean Ceram. Soc. 57, 416 (2020). (Link)
-
R. B. Chung*, A. V. Sampath, and S. Nakamura, “Strain relaxation process of undoped and Si-doped semipolar AlxGa1-xN grown on (20-21) bulk GaN substrate”, J. Crystal Growth 533, 125467 (2020). (Link)
Domestic and International Patents and Applications
-
Domestic patent: 반도체 소자의 제조 방법 및 이에 의해 제조된 반도체 소자 (등록 번호: 10-2394975-00-00)
-
Domestic patent application (2022)
Before 2019 (before joining KNU)
-
R. B. Chung*, G. A. Garrett, R. W. Enck, A. V. Sampath, M. Wraback, and M. L. Reed, “Optical polarization switching in low In-content InGaN MQWs on semipolar (20-21) GaN via strain engineering”, Appl. Phys. Lett. 111, 231107 (2017). (Link)
-
R. B. Chung*, L. E. Rodak, R. W. Enck, A. V. Sampath, M. Wraback, and M. L. Reed, “Growth and impurity characterizations of AlN on (0001) sapphire grown by spatially pulsed MOCVD”, Phys. Sol. Status A 213, 851 (2016).
-
R. B. Chung, D. Kim, S. K. Lim, J. S. Choi, K. J. Kim, B. H. Lee, K. S. Jung, H. J. Kim-Lee, W. J. Lee, K. Woo, B. Park, “4-Inch layer transferred GaN template by ion cut for nitride based light emitting diodes”, Appl. Phys. Exp. 6, 111005 (2013).
-
R. Shivaraman, Y-R Wu, S. Choi, R. B. Chung, J. S. Speck, “Atom probe tomography of III-Nitrides based semiconducting devices”, Microscopy and Microanalysis 19, 956 (2013).
-
R. B. Chung*, C. S. Han, C. C. Pan, N. Pfaff, J. S. Speck, S. P. DenBaars, and S. Nakamura, “The reduction of the efficiency droop using AlInN/GaN superlattice electron blocking layer in light emitting diodes”, Appl. Phys. Lett. 101, 131113 (2012). Highlighted in Semiconductor Today: http://www.semiconductor-today.com/news_items/2012/OCT/UCSB_091012.html
-
R. B. Chung, H. T. Chen, C. C. Pan, J. S. Ha, S. P. DenBaars, and S. Nakamura, “The polarization field dependence of Ti/Al based ohmic contacts on N-type semipolar GaN”, Appl. Phys. Lett. 100, 091104 (2012).
-
G. A. Garrett, P. Rotella, H. Shen, M. Wraback, D. A. Haeger, R. B. Chung, N. Pfaff, E. C. Young, S. P. DenBaars, J. S. Speck, D. A. Cohen, “Carrier dynamics in active regions for ultraviolet optoelectronics grown on thick, relaxed AlGaN on semipolar bulk GaN”, Phys. Stat. Sol. B 249, 507 (2012).
-
D. A. Haeger, E. Young, R. B. Chung, F. Wu, N. Pfaff, M. Tsai, K. Fujito, S. P. DenBaars, J. S. Speck, S. Nakamura, and D. A. Cohen, “384 nm laser diode grown on a (20-21) semipolar relaxed AlGaN buffer layer”, Appl. Phys. Lett. 100, 161107 (2012).
-
R. B. Chung, O. Bierwagen, F. Wu, S. Keller, S. P. DenBaars, J. S. Speck, and S. Nakamura, “Temperature dependent capacitance-voltage analysis of unintentionally doped Al0.82In0.18N grown on GaN”, Jpn. J. Appl. Phys. 50, 101001 (2011).
-
R. B. Chung, F. Wu, R. Shivaraman, S. Keller, S. P. DenBaars, J. S. Speck, and S. Nakamura, “Growth study and impurity characterization of AlxIn1-xN grown by metal organic chemical vapor deposition”, J. Crystal Growth 324, 163 (2011).
-
Y. Zhao, S. Tanaka, Q. Yan, C.Y. Huang, R. B. Chung, C. C. Pan, K. Fujito, D. Feezell, C. G. Van de Walle, J. S. Speck, S. P. DenBaars, and S. Nakamura, “High optical polarization ratio from semipolar (20-2-1) blue-green InGaN/GaN light emitting diodes”, Appl. Phys. Lett. 99, 051109 (2011).
-
S. W. Kaun, M. H. Wong, S. Dasgupta, S. Choi, R. B. Chung, U. K. Mishra, and J. S. Speck, “Effects of threading dislocation density on the gate leakage of AlGaN/GaN heterostructures for high electron mobility transistors”, Appl. Phys. Express 4, 024101 (2011).
-
R. B. Chung, Y. Lin, I. Koslow, N. Pfaff, H. Ohta, J. S. Ha, S. P. DenBaars, and S. Nakamura, “Electroluminescen characterization of (20-21) InGaN/GaN light emitting diodes with various wavelengths”, Jpn. J. Appl. Phys. 49, 070203 (2010).
-
S. Yamamoto, Y. Zhao, C. C. Pan, R. B. Chung, K. Fujito, J. Sonoda, S. P. DenBaars, and S. Nakamura, “High efficiency single quantum well green and yellow-green light emitting diodes on semipolar (20-21) substrates”, Appl. Phys. Express 3, 122102 (2010).
-
I. Koslow, J. Sonoda, R. B. Chung, C. C. Pan, S. Brinkley, H. Ohta, S. Nakamura, and S. P. DenBaars, “High power and high efficiency blue InGaN light emitting diodes on free standing semipolar (30-3-1) bulk GaN substrates”, Jpn. J. Appl. Physics 49, 080203 (2010).
-
Z. Chen, Y. Pei, S. Newman, D. Brown, R. B. Chung, S. Keller, S. P. DenBaars, S. Nakamura, and U. K. Mishra, “Growth of AlGaN/GaN/AlGaN double heterojunction field transistors and the observation of compositional pulling effect”, Appl. Phys. Lett. 94, 171117 (2009).
-
Z. Chen, Y. Pei, S. Newman, R. Chu, D. Brown, R. B. Chung, S. Keller, S. P. DenBaars, S. Nakamura, and U. K. Mishra, “Growth of AlGaN/GaN heterojunction field-effect transistors on insulating GaN using an AlGaN interlayer”, Appl. Phys. Lett. 94, 112108 (2009).
-
K. Vampola, N. Fellows, H. Masui, S. Brinkley, M. Furukawa, R. B. Chung, H. Sato, J. Sonada, H. Hirasawa, M. Iza, S. P. DenBaars, and S. Nakamura, “Highly efficient broad area blue and white light-emitting diodes grown on bulk GaN substrates”, Phys. Stat. Sol. A. 206, 200 (2009).
-
Z. Chen, S. Newman, D. Brown, R. B. Chung, S. Keller, U. K. Mishra, S. P. DenBaars, and S. Nakamura, “High-quality AlN grown on SiC by metal organic chemical vapor deposition”, Appl. Phys. Lett. 93, 191906 (2008).
-
N. Fellows, H. Sato, Y. Lin, R. B. Chung, S. P. DenBaars, and S. Nakamura, “Dichromatic color tuning with InGaN-based light-emitting diodes”, App. Phys. Lett. 93, 121112 (2008).
-
H. Sato, R. B. Chung, H. Hirasawa, N. Fellows, H. Masui, F. Wu, M. Saito, K. Fujito, J. S. Speck, S. P. DenBaars, and S. Nakamura, “Optical properties of yellow light-emitting diode grown on semipolar (11-22) bulk GaN substrates”, Appl. Phys. Lett. 92, 221110 (2008).
-
H. Zhong, A. Tyagi, N. Fellows, F. Wu, R. B. Chung, M. Saito, K. Fujito, J. S. Speck, S. P. DenBaars, and S. Nakamura, “High power and high efficiency blue light emitting diode on free-standing semipolar (10-1-1) bulk GaN substrates”, Appl. Phys. Lett. 90, 233504 (2007).
-
H. Sato, A. Tyagi, H. Zhong, N. Fellow, R. B. Chung, M. Saito, K. Fujito, J. S. Speck, S. P. DenBaars, and S. Nakamura, “High power and high efficiency green light emitting diode on free-standing semipolar (11-2-2) bulk GaN substrate”, Phys. Stat. Sol. (RRL) 1, 162 (2007).
-
A. Tyagi, H. Zhong, R. B. Chung, D. F. Feezell, M. Saito, K. Fujito, J. S. Speck, S. P. DenBaars, and S. Nakamura, “Semipolar (10-1-1) InGaN/GaN laser diodes on bulk GaN substrates”, Jpn. J. Appl. Phys. 46, L444 (2007).
-
H. Zhong, A. Tyagi, N. Fellows, R. B. Chung, M. Saito, K. Fujito, J. S. Speck, S. P. DenBaars, and S. Nakamura, “Demonstration of high power blue-green light emitting diode on semipolar (11-22) bulk GaN substrate”, Electronics Lett. 43, No. 15 (2007).
Conference Proceedings
-
V. Parameshwaran, R. W. Enck, R. B. Chung, S. Kelley, A. V. Sampath, M. L. Reed, X. Xu, B. Clemens, “Photoelectrochemistry of III-V epitaxial layers and nanowires for solar energy conversion”, Proc. SPIE 10194, Micro- and Nanotechnology Sensors, Systems, and Applications IX, 101940N (2017).
-
R. W. Enck, A. V. Sampath, R. B. Chung, D. B. Knorr Jr., G. A. Garrett, M. L. Reed, “Investigation of nucleation and intermixing at hetero-interface in III-Nitride – 4H-SiC structures”, ECS Transactions 72, 9 (2016).
-
A. Bhargava, M. Scott, R. Taylor, R. B. Chung, K. Mrozek, J. Wolter, H. Z. Tan, “Effect of cognitive load on tactile location identification in zero-g”, Symposium on Haptic Interfaces for Virtual Environment and Teleoperator Systems, 2005.
Oral Presentations (International)
-
(Invited) R. B. Chung, R. E. Enck, and A. V. Sampath, “Optical polarization switching in semipolar (20-21) InGaN QWs by strain engineering”, Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices, July, 2019, Busan, S. Korea.
-
R. B. Chung, L. E. Rodak, R. W. Enck, A. V. Sampath, M. Wraback, and M. L. Reed, “Growth pressure dependence of crystal quality in (0001) AlN on sapphire grown by MOCVD under reduced pre-reaction condition”, International Symposium on Compound Semiconductor, June 2015, Santa Barbara, CA, USA.
-
R. B. Chung, E. C. Young, D. A. Haeger, F. Wu, M. Y. Tsai, S. Nakamura, S. P. DenBaars, J. S. Speck, and D. A. Cohen, “Semipolar AlGaN on bulk GaN for UV-C diode lasers”, Conference on Laser and Electro Optics, May 2011, Baltimore, MD, USA.
-
R. B. Chung, O. Bierwagen, F. Wu, S. Keller, S. P. DenBaars, J. S. Speck, and S. Nakamura, “Impurity incorporation and its effect on electrical property of Al0.82In0.18N grown on GaN by MOCVD”, International Symposium on Compound Semiconductor, May 2010, Kagawa, Japan.
-
R. B. Chung, Y. Lin, I. Koslow, N. Pfaff, H. Ohta, J. S. Ha, S. P. DenBaars, and S. Nakamura, “Electroluminescence characterization of InGaN/GaN light-emitting diodes grown on semipolar (20-21) bulk GaN substrate”, International Symposium on Compound Semiconductor, May 2010, Kagawa, Japan.
Patents (US)
-
Patent# 8299452: Method for fabrication of semipolar (Al, In, Ga, B)N based light emitting diodes
-
Patent# 8357925: Optoelectronic device based on non-polar and semi-polar aluminum indium nitride and aluminum indium gallium nitride alloys